粘小球探针
The new sQube® colloidal probe combines the well-known features of the proven NANOSENSORS™ Cont series such as high application versatility and compatibility with most commercial SPMs with a reproducible sphere radius instead of a sharp tip. The excellent radius and the minimized variation of diameter provide reproducible signals.
CONT AFM probes are designed for contact mode (repulsive mode) AFM imaging. This sensor can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due to a low force constant..
The so called "Colloidal Probe Technique", where single colloids are attached to AFM cantilevers for force measurements, opens the chance for a better understanding of fundamental interactions in a variety of fields.
Examples are adhesion phenomena, particle-surface-interactions, mechanical properties, suspensions, hydrodynamics and boundary slip - to name just some out of an increasing number of applications.
The probe offers unique features:
- sphere material: silicon dioxide (SiO2)
- excellent sphere diameter:
A = 2 µm, B = 3.5 µm, C = 6.62 µm, D = 10.2 µm, or E = 15 µm (all +/- 5%)
Due to different masses the resonance frequency can differ.
Please choose A, B, C, D, or E by ordering!
- highly doped silicon cantilever to dissipate static charge
- chemically inert
- high mechanical Q-factor for high sensitivity
- precise alignment of the cantilever position when used together with the Alignment chip
(within +/- 2 µm)
- compatible with PointProbe® Plus XY-Alignment Series
None
AFM Tip:
Sphere
AFM Cantilever:
AFM Cantilever:
Beam
450 µm (440 - 460 µm)*
50 µm (42.5 - 57.5 µm)*
2 µm (1 - 3 µm)*
0.2 N/m (0.02 - 0.77 N/m)*
13 kHz (6 - 21 kHz)*
** typical range range- This product features alignment grooves on the back side of the holder chip.