Coating: Chromium/Platinum Overall
Tip shape: Rotated
Rotated, monolithic silicon AFM probe with symmetric tip shape, designed for force modulation, pulsed force mode (PFM) and electric modes such as:
scanning capacitance microscopy (SCM)
electrostatic force microscopy (EFM)
Kelvin probe force microscopy (KFM)
scanning probe lithography
Electrically conductive coating of 5 nm Chromium and 25 nm Platinum on both sides of the cantilever. This coating also enhances the laser reflectivity of the cantilever.
Coating: Chromium/Platinum Overall
Tip shape: Rotated
Rotated, monolithic silicon AFM probe with symmetric tip shape for contact mode and electric modes such as:
scanning capacitance microscopy (SCM)
electrostatic force microscopy (EFM)
Kelvin probe force microscopy (KFM)
scanning probe lithography
Electrically conductive coating of 5 nm Chromium and 25 nm Platinum on both sides of the cantilever. This coating also enhances the laser reflectivity of the cantilever.