Product Description

NanoWorld Pointprobe® NCH probes are designed for non-contact or tapping™ mode imaging. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.

For enhanced resolution of nanostructures and microroughness we have developed an advanced tip manufacturing process leading to unrivalled sharpness of the Super Sharp Silicon tip.

This probe offers unique features:

• typical tip radius of curvature of 2 nm

• guaranteed tip radius of curvature 5 nm (yield >80%)

• half cone angle < 10° at the last 200 nm of the tip

Coating Description

Uncoated

Full Technical Data